Structure for repairing semiconductor substrates

ABSTRACT

The present invention relates generally to a new structure and a method for repairing semiconductor substrates, and more particularly, the invention encompasses a structure and a method for repairing Printed Circuit Boards or other electronic substrates by providing electrical lines on the defective board. On a substrate that has an open or an electrical discontinuity, after the discontinuity has been established, a portion of the electrical line across from the electrical discontinuity are exposed and one or more trenches or grooves are made between the two or more exposed portions of the electrical line. The two exposed portions of the exposed electrical line is then joined by either an electrical wire that is routed through the trench or using a standard deposition process one or more metals or material are deposited in the open trench to provide or restore electrical continuity and the excess deposition material is removed. This invention also provides means for impedance matching of the net that is repaired.

CROSS-REFERENCE TO A RELATED PATENT APPLICATION

This Patent Application is a Divisional of U.S. patent application Ser.No. 08/137,547, filed on Oct. 15, 1993.

FIELD OF THE INVENTION

The present invention relates generally to a new structure and a methodfor repairing semiconductor substrates, and more particularly, theinvention encompasses a structure and a method for repairing PrintedCircuit Boards or other electronic substrates by providing electricallines on the defective board. An impedance matching method and structureis also disclosed.

BACKGROUND OF THE INVENTION

With the advent of modern day electronics, the circuits on a PCB(Printed Circuit Board) or ceramic modules or chips have become more andmore dense. As a result the electrical lines or conductor lines arethinner and narrower so that more of them can be placed in a given area.Therefore, the probability of the conductor lines having defectsincreases and each of the electronic line carriers have to be inspectedfor faults in the conductor lines. This inspection can be done visually(manually) or automatically, or the lines can also be electricallyverified. Once a fault or defect is found, then it has to be located andrepaired. Most of the methods presently under use require that the faultor defect be visually located by the operator, and then the defectiveconductor line is repaired.

The testing and repairing of the conductor lines are among the mostcritical steps in the packaging technology. This is because theelectronic hardware must be reliable and free from defects, as they arevery expensive to manufacture and the field failures cannot be repairedeasily. To eliminate these immediate and potential defects, tremendousefforts are being made.

The most commonly found defects are opens, or cracks in lines, or shortsbetween lines. Most defects or faults in a conductor line are due tomasking or improper deposition of the conductive material. But theycould also be related to other factors, such as impure material orstretching the resolution limits of the line formation process. Theredistribution lines may have opens due to contamination, processmishaps and physical damage.

Another reason for opens is due to stresses generated during thermalcycles in the bond and test process used during assembly of PCB orceramic modules. The electrical lines with cracks and other latentdefects may also develop opens. These opens must be repaired in order touse the substrate or module or package which is otherwise electricallygood.

Particularly, in the line processing, the electrical redistribution andother interconnection lines are susceptible to defects which couldresult in the lines being electrically open. Defects could includevoids, missing metal, various particle contamination or physical damage.A redundant metal scheme helps to substantially reduce the number ofdefective lines, but this scheme does not eliminate them entirely. Thoselines identified as "open" after electrical test can be repaired byprocesses such as laser CVD (Chemical Vapor Deposition) prior to apolyimide overcoat process. Occasionally a line becomes "open" duringsubsequent thermal processing. These defective conductors appear in themodule or substrate, after pins, capacitors and chips are joined. If an"open" line should be found at this point, it is essential to repair thedefect so that the module or the substrate or the package can be used.

It is disclosed in, "Repairing Breaks in Printed Circuits," IBMTechnical Disclosure Bulletin, Vol. 8, No. 11, Page 1469 (April 1966),that small breaks in a line can be repaired by filling the gap in thebroken line with a material that is cured at room temperature or higherto form a base conductive material. A conductive metal layer is thenelectroplated over the base conductive material to complete the repair.Using this process would require that lines to be repaired, on extremelydense packages with chips, capacitors and discrete wires in place, beisolated during electroplating. This would create significant handlingand tooling problem.

"Open Conductor Repair For Glass Metal Module," IBM Technical DisclosureBulletin, Vol. 14, No. 10, Page 2915 (March 1972), discloses anothermethod of making open repairs. Here a metal line to be transferred isaligned over the open or break, and using a laser beam, a portion of themetal layer is welded to each end of the broken line. This article alsoteaches that the line could be reflowed into the break using a laser orit could be evaporated into the break. Each of these features cannot beused with the present invention, because melting of high temperatureconductive metals, such as copper, is used. Energy required to melt suchlines by laser would damage polyimide adjacent to the lines to berepaired.

A rather complex process for repairs of opens is disclosed in U.S. Pat.No. 4,259,367 (Dougherty, Jr.), where a conductor patch line isinterconnected onto a good line through an insulating layer. Thisrequires the addition of new wiring layers with photolithographictechniques which would be incompatible with a substrate with componentsalready in place.

Another method of repairing opens is by decal transfer as disclosed inU.S. Pat. No. 4,704,304 (Amendola, et al.), and presently assigned toIBM Corporation.

Still another method of electric circuit line repairs is taught in U.S.Pat. No. 4,630,355 (Johnson). A layer of phase-change material isdeposited prior to the deposition of the conductive line and in case anopen results in the conductive line, a current is passed so that aportion of the phase-change material becomes electrically conductive andmakes an electrical bridge across the gap or open. This method is notsuitable for repairs on polyimide films due to lack of adhesion of suchphase-change materials to polyimide.

In U.S. Pat. No. 4,418,264 (Thorwarth), a specifically shaped metallicpart is placed on the conductor path interruption and by means ofmicroresistance welding, the metallic part is welded to the conductor tobridge the interruption. Welding involves melting of the repair materialwhich when used on current "state of the art" electrical polymerpackages could cause structural damage to the polymer. Welding alsorequires the passage of drive currents which would be incompatible withthis invention as there may be active devices which are connected to thelines being repaired at different locations.

Another method of repairing opens and narrow necks has been disclosed inU.S. Pat. No. 4,919,971 (Chen). The defective site in the conductor linehaving a thin portion or a narrow neck does not have to be physicallylocated to initiate the repairs. The process of this invention isself-induced, i.e., the passage of the drive current creates a hot spotat the defective site and conductive material is induced to be depositedat the defective site. The process of this invention is alsoself-limiting, i.e., when the defect has been repaired, the process willslow down and stop by itself. This technique requires the substrate tobe immersed ill a plating bath or be exposed to organometallic vaporswhich would make it incompatible with line repair processes where theactive and passive components have already been mounted on a substrate.

"Conductive Line Jumper/Repair Connection in Glass Metal Module," IBMTechnical Disclosure Bulletin, Vol. 15, No. 8, Page 2423 (January 1973),discloses another method of making open repairs. Here after the open hasbeen located, a wire is placed across the open line and the wire iswelded to each end of the open line. After welding, the repaired planeis glassed over leaving a surface suitable for developing anothercircuit layer. This process teaches the repairs of the carrier at thebuild level, and not at the functional module level. This process alsorequires the use of high melting point metals and a subsequent sinteringof inorganic materials.

Another welding process for repairing of opens is discussed in, "CircuitRepair/Work of Metallized Polyimide Substrates," IBM TechnicalDisclosure Bulletin, Vol. 22, No. 9, Page 3986 (February 1980). A pieceof wire is jumpered across the open and both ends of the jumpered wireare welded to the circuit line, thus yielding a "continuous electricalline." This process also discloses the use of high melting point metals.

Another method of making circuit repairs is disclosed in, "TaillessThermo-Compression Bonding," IBM Technical Disclosure Bulletin, Vol. 27,No. 5, Page 3041 (October 1984), where the circuit line is repaired bypassing an electric current between two electrodes which fuse thecircuit line and the repair material together.

"Josephson Package Repair," IBM Technical Disclosure Bulletin, Vol. 26,No. 12, Pages 6244-6245 (May 1984), is another example of makingrepairs. The faulty circuits are cut out by laser scribing, and therepair of an open is done by cutting the bad line next to the pad andusing a third wiring level to reconnect to the proper pads. This processhas the limitation of requiring photolithographic techniques to form thenew wiring level. Furthermore, additional electrical process stepscannot be done after chips, pins etc, have been attached.

Laser deposition methods are also being developed for repairing circuitopens. As disclosed in U.S. patent application Ser. No. 223,487, filedon Jul. 25, 1988, now U.S. Pat. No. 5,182,230, and presently assigned toIBM Corporation, an open circuit is repaired by laser inducedelectroplating process based on the thermobattery effect. One tip of theopen conductor is heated with a laser beam, and a thermobattery isformed between the hot spot (tip of the conductor) and the cold part(normal section of the conductor). The laser heating of the tip inducesthe conductive material present in the plating solution to be formed atthe hot tip. This process is continued until the growth of theconductive material joins the two open ends of the open, and acontinuous electrical path is formed.

Another process for interconnecting thin-film electrical circuits istaught in U.S. Pat. No. 4,880,959, and presently assigned to IBMCorporation. Both ends of the existing circuit are partially ablated atthe open defect site with pulses from an excimer laser, and then goldmetal is deposited by LCVD (laser chemical vapor deposition). Thisprocess makes the repairs right after the electrical deposition, andprior to any subsequent module build (i.e. at the substrate level).

Under some circumstances a laser, as disclosed in U.S. Pat. No.4,572,941 (Sciaky, et al.), could be used to make spot welds. The laserinduced melting can cause structural damage to sensitive dielectrics andadjoining lines.

Printed circuit boards (PCB) or (board) commonly have thousands of verynarrow electrical lines buried within multiple layers of the board,connecting nodes together. Current manufacturing techniques/capabilitiesoften cause lines to be open or have a discontinuity on a considerablepercentage of total boards manufactured. This open or discontinuitycauses the board to be functionally defective and is normally scrapped.However, some boards could be repaired by using above the board discretewiring, but, above the surface discrete line repair is unsatisfactorybecause it interferes with operations further down the manufacturingline such as component placement and solder wave. Therefore, certainly aneed exists to repair the open or discontinuous lines in a sub-surfacemanner, and which will exhibit electrical/reliability characteristicsequal to the original undamaged line.

This invention also utilizes the use of a double jumper wire for repairof impedance specific internal circuitry which is a further improvementof this invention and which would eliminate the need for the depth ofthe wire routing trench to be maintained with extreme precision, toensure proper distance from the internal planes of the board. Thisprocedure also makes the need to have an exact wire diameter to repairdepth ratio non-existent.

The board repair process offers a means of repairing faulty internalnets in the board. A typical repair process of this invention wouldinclude milling a trench into the board between the endpoints of thenet, bonding the first end of the wire, routing and tacking the wireinto trench with epoxy, then bonding the second end of the wire. Ifrequired, the wire in the trench can also be encapsulated with epoxy.The repaired net can be tested to the desired specifications. Circuitdeletion can also be performed to the desired specification.

The thickness, width and pitch of an electrical line in the board aredependant upon the desired electrical properties of the package. Often asingle electrical line will vary in shape, width and proximity toadjacent features along its total path. As a result, process defects mayresult in opens across these electrical lines, as discussed earlier, ata point where the geometry of the line and the distance to the nearestfeature could be very close. Again, the distance to the nearest featurevary widely from line to line.

The process and structure of this invention guards against the problemsencountered in the prior art. Basically, the location to be repaired islocated by methods well known in the art. After the open or location tobe repaired has been appropriately site dressed, at least one blind holeor groove or trench is formed on the surface of the semiconductormaterial, such as the Printed Circuit Board, typically, using an excimerlaser. For some situations two or more grooves or trenches or blindholes could be formed at the location to be repaired. The one or moregroove or trench is then used to route the electrical wire or theelectrically conductive material along or inside the path of the grooveor trench. The trench or grooves accommodate the wire or theelectrically conductive material and thus eliminate the possibility ofinadvertent shorting.

SUMMARY AND PURPOSES OF THE INVENTION

The invention is a novel method and an apparatus for providing areliable repair of a defective electrical line in a semiconductor item.

Therefore, one purpose of this invention is to provide an apparatus anda method that will provide a reliable repair for an open in asemiconductor item.

Another purpose of this invention is to provide at least one trenchadjacent to an open or an area to be repaired.

Still another purpose of this invention is to provide at least oneelectrically conductive media that will provide electrical continuity toa electrical line while a portion of the electrically conductive mediais in a trench adjacent the defective area.

Yet another purpose of this invention is to eliminate shorting ofadjacent lines during line repair.

In one aspect this invention comprises a method for repairing electricallines on a substrate comprising the following steps:

a. locating an electrical line that has a discontinuity and needs to berepaired,

b. exposing a portion of said electrical line across each end of saiddiscontinuity,

c. forming at least one trench on said substrate between said exposedportions, and

d. making an electrical connection between said exposed portion throughsaid at least one trench to restore electrical continuity to saidelectrical line, and thereby repairing said electrical line.

In another aspect this invention comprises a repaired structurecomprising a carrier having at least one electrical line having adiscontinuity, at least a portion across each end of said discontinuitybeing exposed, at least one trench in said carrier between said exposedends of said discontinuity, an electrical connection routed through saidtrench and between said exposed ends to provide electrical continuity tosaid defective electrical line and thereby providing said repairedstructure.

BRIEF DESCRIPTION OF THE DRAWINGS

The features of the invention believed to be novel and the elementscharacteristic of the invention are set forth with particularity in theappended claims. The figures are for illustration purposes only and arenot drawn to scale. The invention itself, however, both as toorganization and method of operation, may best be understood byreference to the detailed description which follows taken in conjunctionwith the accompanying drawings in which:

FIG. 1, illustrates a top view of one embodiment of the presentinvention.

FIGS. 2 and 3, illustrate a top view of process and structure of thepreferred embodiment of repairing the defective semiconductor item ofthis invention.

FIG. 4, illustrates a process and structure of another embodiment ofrepairing the defective semiconductor item of this invention.

DETAILED DESCRIPTION OF THE INVENTION

This invention describes various methods of repairing opens and nearopens and latent defects in electrical conductor lines.

Latent defects include narrow neck or thin portion or othercontamination related defects. The term latent defects as used herein,also means a small portion or section of a conductor line which has ahigher resistance per unit length than the normal conductor line. Thenarrow neck can be of a different shape, for example, the narrow neckcould be a local reduction in the line width or a local reduction ofline height or thickness or a portion of the line may be made of amaterial with lower conductivity than that of a normal line. The narrowneck could also include a thin electrical connection of a bridge acrossan open circuit, or a crack which before stressing does not show up asan open.

An open as understood in the art, is any missing conductor across whichcurrent cannot flow or is significantly impeded. This typicallyestablishes a resistance threshold above which the electrical conductivepath is considered open.

The method as disclosed by this invention is performed at relatively lowtemperatures, therefore, this method can be used on substrates withmetal/polymer thin film wiring, or other organic materials.

In most cases the protective coating is a polyimide layer or some otherdielectric or insulator layer.

Typically, the material for the electrically conductive metal ormaterial for the electrical line is selected from a group comprisingaluminum, antimony, bismuth, chromium, cobalt, copper, gold, indium,iron, lead, molybdenum, nickel, palladium, platinum, silver, tantalum,tin, titanium, tungsten, or alloys thereof.

In each case where the conductor line has an open or defect, at least aportion of the conductor line or the attached via must be exposed andprepared by appropriate methods to allow subsequent repair. This isknown as site-dressing. In some situations more than one portion of thevia or the electrical line will have to be exposed and prepared. In mostsituations, only a portion of the electrical line or via that will beused in the repair process needs to be exposed and site-dressed. Duringthe site-dressing process it is preferred that at least a portion of theupper surface of the via or the electrical line that is to be repairedis laser ablated, this is done for a number of reasons, such as to cleanthe upper surface of the electrical line or the via.

Interconnection or repair of electrical circuits can be difficult tomake in some instances. For example, the metallurgy in an existingcircuit may consist of multiple layers, where the top most layer is abarrier metal, e.g. chromium, that oxidizes and forms a protective,insulating layer. Similarly, the circuit line could have been overcoatedwith a dielectric material, thus preventing direct access to the site.Before a connection can be made in such circumstances, the protectivelayer(s) must be removed, and in such a way that a good mechanical andelectrical contact can be made between the repair or interconnectionmetallurgy and the existing circuitry. In the operations required forrepair using wire or solder, or combinations thereof, the removalprocess must also create a surface consistent with the additive processbeing used, either wettable by solder, or bondable by wire. One suchremoval process is laser ablation. The removal operation can be readilycontrolled by adjusting the fluence, wavelength and number of laserpulses or shots used, in order not to damage the electrical line or thevia.

In some cases the electrical line beneath the polymer, such aspolyimide, is a line, which has a metallurgical stack where the toplayer is non-bondable to a metal unless a sub-layer is exposed which ismore bondable. This sub-layer could be exposed using laser ablation. Inthis situation the top layer is typically Cr, and once the polyimide orsimilar insulator coating is removed, Cr gets oxidized, thus preventingthe repair. In such circumstances the laser ablation could be used toremove the oxidized Cr layer and exposing a sub-layer, such as Cu, thatcan be used to carry out the line repair.

One such cleaning of bonding surfaces using a laser is disclosed in,"Laser Ablative Cleaning of Bonding Surfaces," IBM Technical DisclosureBulletin, Vol. 32, No. 4A, Pages 429-430 (September 1989).

FIG. 1, illustrates a top view of a typical defect or discontinuity on asemiconductor item 10, such as a Printed Circuit Board, or substrate,such as a ceramic or a glass-ceramic substrate, having at least one via11. For the ease of illustrating the invention the semiconductor item10, will hereinafter be referred to as the board 10. An open or defecton the board 10, could be due to a variety of reasons, such as a resultof a manufacturing process defect or could be due to a deliberateattempt to fix an electrical connection. On a typical board 10, thereare one or more electrical lines that are buried inside the board 10.These buried lines could be a single level line or multi-level line. Asillustrated in FIG. 1, the buried wiring line between repair via 12, andrepair via 22, is defective, as it is not providing the desired internalelectrical connection, therefore, there is a need to establish a directelectrical connection by external means that does not interfere withsubsequent processing of the board.

Typically, in order to form a continuous and reliable electricalconnection between the vias 12 and 22, the buried wiring line will bedestroyed by methods well known in the art. One such method ofdestroying a buried wiring line is to pass a high electrical currentbetween the two vias 12 and 22, which would result in a permanent openor discontinuity.

Once it has been established that the buried wiring connection does notexist between the vias 12 and 22, a routing groove or trench 14, betweenthe vias 12 and 22, is formed as discussed elsewhere. The trench shouldbe formed so as not to damage the vias 11, adjacent to the trench 14, orany buried electrical lines below the trench 14. A repair foil or wire16, is then routed through the trench 14, and one end of the repair wire16, is secured to the repair via 12, while the other end of the wire 16,is secured to the repair via 22, by means well known in the art.Typically, the wire 16, would be secured to the vias 12 and 22, by meansof soldering or brazing or other types of electrical and mechanical typebonding or securing methods. As discussed elsewhere the vias 12 and 22,must also be site-dressed to provide a good and reliable electrical andmechanical connection to the repair wire 16. Once the repair wire 16,has made a direct external connection between the vias 12 and 22, theelectrical connection can be checked and verified by means well known inthe art. Of course, an insulator or a non-electrically conductivepolymer type material can also be applied over the board 10, or just thetrench 14, in order to protect and secure the wire 16, inside the trench14.

The material for repair wiring line or foil 16, is typically selectedfrom a group comprising aluminum, antimony, bismuth, chromium, cobalt,copper, gold, indium, iron, lead, molybdenum, nickel, palladium,platinum, silver, tantalum, tin, titanium, tungsten, or alloys thereof.The board 10, could be single layer or multilayer, and the material forthe board 10, could be selected from a group consisting of ceramic,glass ceramic, other insulative material, to name a few.

FIGS. 2 and 3, illustrate a top view of process and structure of thepreferred embodiment of repairing the defective semiconductor item ofthis invention. After the defect has been located it can be easilyrepaired by the method and process illustrated in FIG. 1, however, insome cases it may be necessary to match the impedance of the buried wirethat was defective and which was destroyed. FIGS. 2 and 3, illustrateshow impedance matching can be achieved by this invention, on a board20, using double jumper wires. By methods well known in the art anddiscussed earlier a routing trench 14, is made between a repair via 32and repair via 42. Both the vias 32 and 42, and the trench 14, aresite-dressed as discussed earlier.

After a repair wire or foil 26, is made to provide the direct externalelectrical connection between the vias 32 and 42, at least one groundvia 18, is located that theoretically will provide the impedance match.Using the same methods as used to make the routing trench 14, a groundgroove or trench 24, is made typically, between the ground via 18, andrepair via 32 or 42. Of course the ground via 18, and the ground trench24, should be properly site dressed to provide a good mechanical andelectrical connection to a ground wire or foil 36, that runs between theground via 18, and the repair via 32. In order to optimize the realestate on the board 20, the ground trench 24, and the routing trench 14,could overlap for some distance. Of course one can have more than onetrench 14 and 24, on the board 20, and similarly a more optimum trenchrouting could be achieved using more sophisticated computer programs.Furthermore, the trenches 14 and 24, should be wide and deep enough toaccommodate the wires 26 and 36, and so as to fully serve their purpose.

The trenches 14 and 24, are typically made using methods well known inthe art, such as laser ablation, ion milling, to name a few.

The trenches 14 and 24, are made on the board 20, which is typically aninsulator type material, such as ceramic or glass ceramic, and thismaterial is typically much more soft and easy to cut than the metalmaterial used to make the line connections.

FIG. 4, illustrates a process and structure of another embodiment ofrepairing the defective semiconductor item 40, using this invention.After the area in and around the repair vias 12 and 22, and the routingtrench 14, have already been site-dressed, an electrically conductivematerial 46, such as an electrically conductive paste or epoxy or anadhesive strip, is then made to provide the desired electricalconnection via the routing trench 14, by methods well known in the art.Such method could include, using a laser or hot gas reflow method, toname a few, and that the electrically conductive material 46, mustphysically make an external electrical connection between the two repairvias 12 and 22, and restores electrical connection between the two vias12 and 22. The excess material from the electrically conductive material46, is removed by methods well known in the art. The electricallyconductive material 46, could be a solder or solder-type material, or anelectrically conductive material that can be reflowed without damagingor harming the electrical lines or vias or other items on the board 40.Of course the electrically conductive material 46, could be anelectrically conductive material that has a coating of a material thatcan be reflowed, such as, for example, a solder or a solder-typematerial.

Of course one could have more electrical lines and other features on theboard 10, 20 or 40. The TSL (Top Surface Length) of the trench 14,should be such that it accommodates all of the electrically conductivematerial 46, flowing into it, and further does not allow the material init to contact the adjacent electrical items, such as vias 11, and startcreating a short.

The electrically conductive material 46, or the wires 16, 26 and 36,could be secured to the vias or the wires, by methods well known in theart, such as the method could be selected from a group comprisingultrasonic bonding, brazing, thermal compression bonding, or lasersonicbonding.

Electrically conductive material 46, such as gold, can be deposited inthe trench 14, using the standard prior art method, such as, CVDdeposition or laser ablation, to name a few, which results in the goldor electrically conductive metal 46, being deposited in the trench 14,between the vias 12 and 22.

The trench 14, of course has to be deep enough to capture all theelectrically conductive material 46, as discussed earlier, so as not tocreate a problem of the metal or gold forming a bridge between the twoadjacent electrical lines or vias.

It was found that deeper grooves or trenches in the board 10, 20 or 40,lead to better results. There may be product or other physicallimitations that may exist, however, which may prevent the use of deepgrooves 14 or 24, such as thin dielectric material in a multilayerelectrical structure or underlying wiring or features being too close tothe surface that is being used to form these trenches or grooves 14 or24. In these cases, a series of two or more shallow grooves 14 or 24, inparallel would also produce the desired effects.

Furthermore, at least a portion of the deposited electrically conductivematerial 46, or the wires 16, 26 or 36, could be covered with at leastone low temperature electrically conductive material, such as, solder,and wherein the low temperature electrically conductive material couldbe secured to the deposited electrically conductive material by a methodselected from hot gas reflow, furnace reflow, thermode, or laser reflow.Moreover, at least a portion of the deposited electrically conductivematerial could be covered with solder, and wherein the solder could besecured to the electrical line by a method selected from hot gas reflow,furnace reflow, thermode, or laser reflow.

The metallurgical bond that is formed between the deposited electricallyconductive material and the electrical line could be by melting of thesolder. The electrically conductive material that provides the externalelectrical connection could be selected from a group comprising anelectrically conductive organometallic material or an electricallyconductive polymeric material or an electrically conductive epoxy, or anelectrically conductive adhesive, to name a few.

After the open has been repaired the further processing of the carrieror substrate could continue normally. For, example, at least a portionof the deposited electrically conductive material or the wires could becovered with at least one insulator material, wherein the insulatormaterial could be polymer. Of course for any subsequent processing itwould be advantageous to at least planarize the repaired area so thatsubsequent levels do not pose any manufacturing or reliability problems.

It would be preferred that the area of the site dressed location is atleast 25 percent larger than the average cross-sectional dimensions ofthe electrical line or the electrically conductive material that isdeposited in the trench.

The boards may also be repaired at any time in the assembly process.Repair could take place before the outer coatings are placed on theboard.

The routing trench that is machined into the board can be made toaccommodate any size wire that is required. The path a trench will takewill be to ensure that the trench will not conflict with any SMT(Surface Mounted) devices or other components that may be placed on theboard during final assembly. The depth of the trench into the board canalso be controlled so as to maintain a uniform distance fromground/power planes.

The type of wire that is used for the repair depends largely on theimpedance requirements. The invention allows for the use of bothinsulated or non-insulated wire, of varying diameters, depending onwhich type is required for a given repair.

The bonding process is normally conducted using an ultrasonic weldingmachine. The ultrasonic welding process allows a strong bond to becreated without creating a large heat affected area, which may causedamage. Since this process creates a bond using friction, the boardshould not come in contact with chemical solvents or other cleaning orshielding products.

After the bonding process is complete the wire is routed into the trenchand can also be tacked by epoxy. If the board is repaired prior to thefinal coating being applied the need for epoxy encapsulation may notexist.

Testing conducted on the repaired net will be according to the desiredspecifications. A typical testing procedure would involve endpointcontinuity test of the repaired net, and Time Delay Reflectometry (TDR)to check propagation delay as well as impedance.

This board repair process provides a highly reliable, cost effectivesolution for repairing all types of circuit boards.

The use of a double jumper wire for repair of impedance specificinternal circuitry would eliminate the need for the depth of the wirerouting trench to be maintained with extreme precision or to ensureproper distance from the internal planes of the board. This procedurealso makes the need to have an exact wire diameter to repair depth rationon-existent.

Specific impedance requirements are needed on some nets of multi-wirecircuit boards to maintain proper electrical signals. Repairing adamaged net, that is impedance specific, results in the need to have atight tolerance on both the wire diameter and the distance from thecenter of the wire to the ground plane. By using this double jumper wirerepair method, the need for tight tolerances are not necessary.

In order to match the impedance of an internal net, the distance betweenthe wire and the ground plane is critical. Sometimes conditions existthat do not allow the correct distance to be achieved without milling atrench into the board that would result in damage to internal circuitry.A search for a method that would allow an impedance match withoutcausing damage to the internal circuits resulted in the use of a doublejumper wire based on the fact that it could solve the problem with aminimum of added expense to the process. Therefore this invention asillustrated provides a method and structure of matching impedance of thejumper wire to that of internal nets.

After the repair has been made, the quality of the repair net is firstsubjected to a continuity test to ensure that the repair wire made anadequate electrical connection. Next, the impedance of the repair net ismonitored using a TDR meter. The double wire repair method of thisinvention has been found to provide the closest impedance matchpossible, with a minimum of effort and cost. This inventive process andstructure has the added advantage that It does not require highprecision tooling.

EXAMPLES

The following examples are intended to further illustrate the inventionand are not intended to limit the scope of the invention in any manner.

Examples 1 through 6, disclose a sub-surface PCB repair process whereapplications do not require impedance matching. Example 7, describes thepreferred method of repairing a board while taking into accountimpedance matching.

EXAMPLE 1

Channels or trenches about 2 to 10 mils wide and 5 mils deep weremicro-milled into the PCB and into the surface of the PCB to expose thecopper barrel or vias at each end of the line to be repaired. A wire wasthen press fitted into the channel in lieu of epoxy, and each end of thewire was interconnected to the copper vias using an electricallyconductive epoxy. Thus a sub-surface repair was accomplished, andelectrical continuity was established between the two copper vias.

EXAMPLE 2

This example is similar to method of Example 1, except that a smallerdiameter wire was used and was held in the trench with dabs ofnon-conductive epoxy. The trench was then encapsulated with a polymer,and excess polymer material was removed, so that the polymer was flushwith the surface of the PCB. Here inter-connection to the copper viaswere made by either conductive epoxy or ultrasonic bonding.

EXAMPLE 3

The method of Example 3, is similar to the one disclosed for Example 2,except that instead of using a wire, one half of the depth of the trenchwas filled with an electrically conductive epoxy. The polymer was thenplaced over the epoxy to seal it. Electrical interconnection between thecopper vias was made by the epoxy.

EXAMPLE 4

In this example an electrically conductive copper foil was used in lieuof an electrically conductive paste or wire. The same trench wasmicro-milled as specified in Example 1, and the electrically conductivecopper foil was inserted into the trench. The electrical interconnectionto the copper via was accomplished by using an electrically conductivepaste as specified in an earlier example. A polymer was then placed atopthe copper foil within the trench, such that the polymer was flush withthe top of the PCB.

EXAMPLE 5

In this example an electrically conductive adhesive strip, in lieu of awire, paste, or copper foil, was used. The subsurface trench,interconnection, and the polymer used were the same as specified inExample 2.

EXAMPLE 6

The method of this example was similar to the method of Example 2,except that a flat or rectangular type wire was employed. This flat orrectangular type wire was obtained by flattening a round wire using apress. This allowed for larger diameter wire to be used where trenchdepth is restricted. 90 degree bends were employed where necessary byflattening the pre-determined shape in a press. Interconnections weremade using ultrasonic bonding.

EXAMPLE 7

The preferred repair procedure for the PCB is as follows. A trench wasmilled into the surface of the board between the two endpoints of thefaulty net. Each end of the trench diverged. One end of the trenchterminated on the via of the net being repaired, and the other on aground pin or via of the same array. Next an insulated wire was bondedto the repair via, and a second insulated wire was bonded to the groundvia or pin of the array. Then both wires were tacked into the wirerouting trench using epoxy. The final step was to bond the second end ofthe repair wire to the second repair via and the ground wire to theadjacent ground via as before. This resulted in an impedance matchedrepair.

While the present invention has been particularly described, inconjunction with a specific preferred embodiment, it is evident thatmany alternatives, modifications and variations will be apparent tothose skilled in the art in light of the foregoing description. It istherefore contemplated that the appended claims will embrace any suchalternatives, modifications and variations as falling within the truescope and spirit of the present invention.

What is claimed is:
 1. A repaired structure comprising a carrier havingat least one electrical line having a discontinuity and forming at leastone first segment and at least one second segment, at least a portion ofsaid first segment and at least a portion of said second segment areexposed, at least one trench in said carrier between the exposedsections of said first segment and said second segment, an electricalconnection having a first end and a second end routed through saidtrench and wherein said first end is secured to at least a portion ofsaid exposed first segment and wherein said second end is secured to atleast a portion of said exposed second segment to provide electricalcontinuity to said defective electrical line and thereby providing saidrepaired structure.
 2. The repaired structure of claim 1, wherein saidelectrical connection is at least one electrically conductive wire. 3.The repaired structure of claim 1, wherein said electrical connection isat least one electrically conductive media.
 4. The repaired structure ofclaim 3, wherein said electrically conductive media is selected from agroup consisting of electrically conductive polymer or an electricallyconductive epoxy or an electrically conductive adhesive or anelectrically conductive organometallic material.
 5. The repairedstructure of claim 1, wherein the material for said electricalconnection is selected from a group comprising aluminum, antimony,bismuth, chromium, cobalt, copper, gold, indium, iron, lead, molybdenum,nickel, palladium, platinum, silver, tantalum, tin, titanium, tungsten,or alloys thereof.
 6. The repaired structure of claim 3, wherein thematerial for said electrically conductive media is selected from a groupcomprising aluminum, antimony, bismuth, chromium, cobalt, copper, gold,indium, iron, lead, molybdenum, nickel, palladium, platinum, silver,tantalum, tin, titanium, tungsten, or alloys thereof.
 7. The repairedstructure of claim 3, wherein said electrically conductive media isselected from a group comprising solder, solder coated metal, or a metalcovered with a low temperature electrically conductive material or afoil or a flat wire or a rectangular type wire.
 8. The repairedstructure of claim 1, wherein said electrical connection is a lowtemperature electrically conductive material.
 9. The repaired structureof claim 1, wherein at least a portion of said electrical connection hasa coating of at least one low temperature electrically conductivematerial.
 10. The repaired structure of claim 9, wherein said at leastone low temperature electrically conductive material is solder.
 11. Therepaired structure of claim 1, wherein at least a portion of saidelectrical connection has a coating of at least one insulator material.12. The repaired structure of claim 1, wherein at least a portion ofsaid electrical connection has a coating of at least one polymermaterial.
 13. The repaired structure of claim 1, wherein said carrierhas at least one second trench having at least one second electricalconnection to provide impedance matching.